Information Technology / Static Information Storage And Retrieval / Testing

	Programming method for the selective healing of over-erased cells on a flash erasable programmable read-only memory device
	Multi-state EEprom read and write circuits and techniques
	Multi-chip module testing
	Semiconductor memory device capable of high speed plural parallel test, method of data writing therefor and parallel tester
	Semiconductor memory apparatus having refresh test circuit
	Semiconductor memory device including dynamic type memory and static type memory formed on the common chip and an operating method thereof
	Semiconductor integrated circuit and method for testing memory
	Parallel tester capable of high speed plural parallel test
	Semiconductor memory device including dynamic type memory and static type memory formed on the common chip and an operating method thereof
	Semiconductor memory module
	System and method for an antifuse bank
	Dram with reduced-test-time mode
	Forced substrate test mode for packaged integrated circuits
	Integrated circuit having forced substrate test mode with improved substrate isolation
	Integrated circuit memory devices having direct access mode test capability and methods of testing same
	Circuit for SRAM test mode isolated bitline modulation
	Apparatus and method for disabling and re-enabling access to IC test functions
	Integrated circuit having forced substrate test mode with improved substrate isolation
	Redundancy analysis for embedded memories with built-in self test and built-in self repair
	Semiconductor integrated circuit capable of testing and substituting defective memories and method thereof
	Integrated memory and method for testing and repairing the integrated memory
	Electrically alterable nonvolatile semiconductor memory
	Programmable and electrically configurable latch timing circuit
	Apparatus and method for testing for defects between memory cells in packaged semiconductor memory devices
	Test circuit for testing a circuit
	Synchronous semiconductor memory device capable of rapidly, highly precisely matching internal clock phase to external clock phase
	Selective application of voltages for testing storage cells in semiconductor memory arrangements
	Method of measuring retention performance and imprint degradation of ferroelectric films
	Method of evaluating the gate oxide of non-volatile EPROM, EEPROM and flash-EEPROM memories
	Memory array organization and related test method particularly well suited for integrated circuits having write-once memory arrays
	Circuit and method of operating a ferrolectric memory in a DRAM mode
	Multi-state EEprom read and write circuits and techniques
	Nonvolatile semiconductor memory device and manufacturing method and testing method thereof
	Method and apparatus for verifying the programming of multi-level flash EEPROM memory
	Method for sorting semiconductor devices having a plurality of non-volatile memory cells
	High reliability triple redundant latch with voting logic on each storage node
	Memory device and method of storing fail addresses of a memory cell
	Semiconductor memory device test apparatus
	Apparatus and method for testing a memory
	Memory testing apparatus
	Method and apparatus for testing embedded DRAM
	Semiconductor memory, method of testing semiconductor memory, and method of manufacturing semiconductor memory
	Semiconductor memory device performing redundancy repair based on operation test and semiconductor integrated circuit device having the same
	Semiconductor memory device allowing spare memory cell to be tested efficiently
	Testing an integrated circuit device
	Method for testing an on-chip cache for repair
	Memory system with non-volatile data storage unit and method of initializing same
	Microprocessor memory test circuit and method
	Circuit and method for performing tests on memory array cells using external sense amplifier reference current
	Circuit and method for performing test on memory array cells using external sense amplifier reference current
	Circuit and method for performing tests on memory array cells using external sense amplifier reference current