Information Technology

Static Information Storage And Retrieval

Testing

No:6324088

256 meg dynamic random access memory

No:7477556

256 meg dynamic random access memory

No:7477557

256 meg dynamic random access memory

No:6826099

2t2c signal margin test mode using a defined charge and discharge of bl and /bl

No:6876590

2t2c signal margin test mode using a defined charge exchange between bl and/bl

No:6590817

6f2 dram array with apparatus for stress testing an isolation gate and method

No:6735132

6f2 dram array with apparatus for stress testing an isolation gate and method

No:6894937

Accelerated life test of mram cells

No:6445614

Accelerated testing method and circuit for non-volatile memory

No:7349273

Access circuit and method for allowing external test voltage to be applied to isolated wells

No:7286421

Active compensation for operating point drift in mram write operation

No:7453747

Active compensation for operating point drift in mram write operation

No:6711076

Active restore weak write test mode

No:6829183

Active restore weak write test mode

No:6018815

Adaptable scan chains for debugging and manufacturing test purposes

No:7085183

Adaptive algorithm for mram manufacturing

No:7224628

Adaptive algorithm for mram manufacturing

No:7321519

Adaptive algorithm for mram manufacturing

No:7369430

Adaptive algorithm for mram manufacturing

No:5105425

Adaptive or fault tolerant full wafer nonvolatile memory

No:6449190

Adaptive reference cells for a memory device

No:5003203

Adaptive reference voltage generation circuit for pla sense amplifiers

No:5805522

Address access path control circuit

No:5339277

Address buffer

No:6367030

Address conversion circuit and address conversion system with redundancy decision circuitry

No:6906970

Address counter strobe test mode device

No:5233566

Address detector of a redundancy memory cell

No:5726994

Address multiplex semiconductor memory device for enabling testing of the entire circuit or for only partial components thereof

No:5500824

Adjustable cell plate generator

No:7394708

Adjustable global tap voltage to improve memory cell yield

No:6388460

Alternate timing wafer burn-in method

No:5410687

Analyzing device for saving semiconductor memory failures

No:7339848

Anti-fuse latch circuit and method including self-test

No:6570798

Antifuse memory cell and antifuse memory cell array

No:6255837

Apparatus and method disabling and re-enabling access to ic test functions

No:5781485

Apparatus and method for controlling operating mode in semiconductor memory device

No:5526312

Apparatus and method for determining the resistance of antifuses in an array

No:6255838

Apparatus and method for disabling and re-enabling access to ic test functions

No:6977855

Apparatus and method for dynamically repairing a semiconductor memory

No:7468922

Apparatus and method for dynamically repairing a semiconductor memory

No:6338154

Apparatus and method for generating addresses in a built-in self memory testing circuit

No:5959911

Apparatus and method for implementing a bank interlock scheme and related test mode for multibank memory devices

No:7307911

Apparatus and method for improving sensing margin of electrically programmable fuses

No:6141276

Apparatus and method for increasing test flexibility of a memory device

No:6459635

Apparatus and method for increasing test flexibility of a memory device

No:4051355

Apparatus and method for increasing the efficiency of random access storage

No:5892777

Apparatus and method for observing the mode of a memory device

No:7038956

Apparatus and method for reading out defect information items from an integrated chip

No:6986084

Apparatus and method for reducing test resources in testing drams

No:7168018

Apparatus and method for reducing test resources in testing drams