Electricity

Electricity: Measuring And Testing

With Probe Elements

No:7084654

“2-step contact” clamping fixture for the flexible print circuit on a head gimbal assembly

No:5642054

Active circuit multi-port membrane probe for full wafer testing

No:6518782

Active power monitoring using externally located current sensors

No:5323107

Active probe card

No:4780670

Active probe card for high resolution/low noise wafer level testing

No:7427868

Active wafer probe

No:5491426

Adaptable wafer probe assembly for testing ics with different power/ground bond pad configurations

No:5109596

Adapter arrangement for electrically connecting flat wire carriers

No:6147505

Adapter arrangement for electrically testing printed circuit boards

No:6650134

Adapter assembly for connecting test equipment to a wireless test fixture

No:6191594

Adapter for a measurement test probe

No:6636058

Adapter for a multi-channel, low input capacitance signal probe

No:4774459

Adapter for a printed circuit board testing apparatus

No:4788496

Adapter for a printed circuit board testing device

No:7362087

Adapter for circuit board examination and device for circuit board examination

No:7463044

Adapter for positioning of contact tips

No:5506510

Adaptive alignment probe fixture for circuit board tester

No:6118288

Adaptive pcb testing system employing rearrangable test probes

No:5517127

Additive structure and method for testing semiconductor wire bond dies

No:4719411

Addressable test matrix for measuring analog transfer characteristics of test elements used for integrated process control and device evaluation

No:4923407

Adjustable low inductance probe

No:4973903

Adjustable probe for probe assembly

No:7368930

Adjustment mechanism

No:7112975

Advanced probe card and method of fabricating same

No:7141994

Air socket for testing integrated circuits

No:7233158

Air socket for testing integrated circuits

No:6717422

Air socket for testing integrated circuits

No:6690184

Air socket for testing integrated circuits

No:2954521

Air-actuated electrical contact probe

No:7148713

Algoristic spring as probe

No:6426637

Alignment guide and signal transmission apparatus and method for spring contact probe needles

No:6822466

Alignment/retention device for connector-less probe

No:4179652

Analyzing electrical circuit boards

No:7190180

Anisotropic conductive connector and production method therefor and inspection unit for circuit device

No:7095241

Anisotropic conductive connector, probe member, wafer inspecting device, and wafer inspecting method

No:6870385

Anisotropic conductive sheet and wafer inspection device

No:7049836

Anisotropic conductivity connector, conductive paste composition, probe member, and wafer inspection device, and wafer inspecting method

No:7071722

Anisotropic, conductive sheet and impedance measuring probe

No:6969622

Anisotropically conductive connector, its manufacture method and probe member

No:7446545

Anisotropically conductive sheet

No:6720787

Anisotropically conductive sheet, production process thereof and applied product thereof

No:5262718

Anisotropically electrically conductive article

No:6680617

Apertured probes for localized measurements of a material's complex permittivity and fabrication method

No:6127835

Apparatus and method for assembling test fixtures

No:6175243

Apparatus and method for assembling test fixtures

No:7061227

Apparatus and method for calibrating a semiconductor test system

No:7005868

Apparatus and method for canceling dc errors and noise generated by ground shield current in a probe

No:6340838

Apparatus and method for containing semiconductor chips to identify known good dies

No:5712571

Apparatus and method for detecting defects arising as a result of integrated circuit processing

No:6632691

Apparatus and method for determining doping concentration of a semiconductor wafer