Electricity

Electricity: Measuring And Testing

Dut Including Test Circuit

No:6967496

Ac testing of leakage current in integrated circuits using rc time constant

No:7348790

Ac testing of leakage current in integrated circuits using rc time constant

No:4712058

Active load network

No:6897674

Adaptive integrated circuit based on transistor current measurements

No:7308629

Addressable tap domain selection circuit with tdi/tdo external terminal

No:5541553

Amplifier with a function for switching on and off the output signal

No:7327153

Analog built-in self-test module

No:5610530

Analog interconnect testing

No:5418470

Analog multi-channel probe system

No:5744949

Analog test cell circuit

No:5705934

Analog voltage output circuit

No:7151387

Analysis module, integrated circuit, system and method for testing an integrated circuit

No:6255837

Apparatus and method disabling and re-enabling access to ic test functions

No:5861774

Apparatus and method for automated testing of a progammable analog gain stage

No:6879173

Apparatus and method for detecting and rejecting high impedance failures in chip interconnects

No:6995581

Apparatus and method for detecting and rejecting high impedance failures in chip interconnects

No:5818250

Apparatus and method for determining the speed of a semiconductor chip

No:6160413

Apparatus and method for disabling and re-enabling access to ic test functions

No:6255838

Apparatus and method for disabling and re-enabling access to ic test functions

No:6853175

Apparatus and method for measuring electrical characteristics of a semiconductor element in a packaged semiconductor device

No:6762608

Apparatus and method for testing fuses

No:6690189

Apparatus and method for testing semiconductor integrated circuit

No:6140831

Apparatus and methods selectively deriving a boosted voltage exceeding an internal voltage

No:6894526

Apparatus for determining burn-in reliability from wafer level burn-in

No:7215134

Apparatus for determining burn-in reliability from wafer level burn-in

No:5627478

Apparatus for disabling and re-enabling access to ic test functions

No:7268573

Apparatus for generating test stimulus signal having current regardless of internal impedance changes of device under test

No:6445204

Apparatus for probing digital signals within printed circuit boards

No:4782283

Apparatus for scan testing cmos integrated systems

No:6864699

Apparatus for testing integrated circuits having an integrated unit for testing digital and analog signals

No:6842028

Apparatus for testing reliability of interconnection in integrated circuit

No:7005871

Apparatus, system, and method for managing aging of an integrated circuit

No:7403027

Apparatuses and methods for outputting signals during self-heat burn-in modes of operation

No:6255842

Applied-voltage-based current measuring method and device

No:6066953

Architecture for rf signal automatic test equipment

No:5572160

Architecture for rf signal automatic test equipment

No:5770947

Arrangement for testing a gate oxide

No:7421365

Automated circuit board test actuator system

No:6639397

Automatic test equipment for testing a device under test

No:7395518

Back end of line clone test vehicle

No:7259582

Bonding pads for testing of a semiconductor device

No:7350120

Buffered memory module and method for testing same

No:5982189

Built-in dynamic stress for integrated circuits

No:7394272

Built-in self test for system in package

No:5570035

Built-in self test indicator for an integrated circuit package

No:7042242

Built-in self test technique for programmable impedance drivers for rapidchip and asic drivers

No:6867613

Built-in self timing test method and apparatus

No:7005873

Built-in self-test hierarchy for an integrated circuit

No:6255836

Built-in self-test unit having a reconfigurable data retention test

No:6037792

Burn-in stress test mode